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The role of low temperature growth defects for the stability of strained Si/Si1−xGex heterostructures

✍ Scribed by H.H. Radamson; W.-X. Ni; G.V. Hansson


Publisher
Elsevier Science
Year
1996
Tongue
English
Weight
260 KB
Volume
102
Category
Article
ISSN
0169-4332

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