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The structural stability of uncapped versus buried Si1−xGex strained layers through high temperature processing

✍ Scribed by D.C. Houghton; C.J. Gibbings; C.G. Tuppen; M.H. Lyons; M.A.G. Halliwell


Publisher
Elsevier Science
Year
1989
Tongue
English
Weight
681 KB
Volume
183
Category
Article
ISSN
0040-6090

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