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The rapid measurement of generation lifetime in MOS capacitors with long relaxation times

✍ Scribed by Keller, W.W.

Book ID: 114595987
Publisher: IEEE
Year: 1987
Tongue: English
Weight: 632 KB
Volume: 34
Category: Article
ISSN: 0018-9383
DOI: 10.1109/t-ed.1987.23056

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