𝔖 Bobbio Scriptorium
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A quick method for the determination of bulk generation lifetime in semiconductors from pulsed MOS capacitance measurements

✍ Scribed by K.S. Rabbani; D.R. Lamb


Book ID
107856568
Publisher
Elsevier Science
Year
1981
Tongue
English
Weight
244 KB
Volume
24
Category
Article
ISSN
0038-1101

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