✦ LIBER ✦
On the measurement of surface state density and diffusion component from bulk in MOS capacitors with long relaxation time
✍ Scribed by Siennicki, A.; Zaleski, A.
- Book ID
- 114535062
- Publisher
- IEEE
- Year
- 1989
- Tongue
- English
- Weight
- 155 KB
- Volume
- 36
- Category
- Article
- ISSN
- 0018-9383
- DOI
- 10.1109/16.19952
No coin nor oath required. For personal study only.