Identification and carrier dynamics of t
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Klein, P. B.
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Article
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2009
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John Wiley and Sons
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English
⚖ 875 KB
## Abstract The identity and characteristics of the lifetime limiting defects in n‐type 4H‐SiC epitaxial layers are of particular current interest, due to the suitability of this material for high‐power, solid‐state switching devices. Much work has been done in the past decade to identify the spect