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The Migration of Metal and Oxygen during Anodic Film Formation

✍ Scribed by Davies, J. A.; Domeij, B.; Pringle, J. P. S.; Brown, F.

Book ID
118017572
Publisher
The Electrochemical Society
Year
1965
Tongue
English
Weight
768 KB
Volume
112
Category
Article
ISSN
0013-4651

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πŸ“œ SIMILAR VOLUMES

Migration of incorporated phosphorus in
Migration of incorporated phosphorus in the anodic oxide film formation of tantalum
✍ Fumihiro Arifuku; Hiroshi Yoneyama; Hideo Tamura πŸ“‚ Article πŸ“… 1979 πŸ› Elsevier Science 🌐 English βš– 337 KB

Almbxct -The mobility of phosphorus incorporated as a mass marker into tantalum anodic oxide films was investigetcd by mtans of ion microprobe mass analysis. If the transport number of tantalum ions for the film formation is ~ssumcd to be CotMant regardless of the oxidation current density chosen, t