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The influence of the Coulomb interaction effect in the electron beam on the developed resist structure for the projection lithography

✍ Scribed by M. Kotera; M. Sakai; K. Yamada; K. Tamura; Y. Tomo; I. Simizu; A. Yoshida; Y. Kojima; M. Yamabe


Book ID
114155292
Publisher
Elsevier Science
Year
2001
Tongue
English
Weight
383 KB
Volume
57-58
Category
Article
ISSN
0167-9317

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