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The influence of silicon heat treatments on the minority carrier generation and the dielectric breakdown in MOS structures

✍ Scribed by J. M. Green; C. M. Osburn; T. O. Sedgwick


Book ID
112812589
Publisher
Springer US
Year
1974
Tongue
English
Weight
790 KB
Volume
3
Category
Article
ISSN
0361-5235

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