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The Influence of Minority Carrier Injection on Subthreshold Defects in Silicon

✍ Scribed by Yunusov, M. S. ;Abdurakhmanova, S. N. ;Zaikovskaya, M. A. ;Oksengendler, B. L.

Publisher: John Wiley and Sons
Year: 1984
Tongue: English
Weight: 228 KB
Volume: 81
Category: Article
ISSN: 0031-8965
DOI: 10.1002/pssa.2210810252

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