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The influence of deep-level impurities on the admittance of GaP p+–n junctions

✍ Scribed by Krispin, P. ;Maege, J.

Publisher: John Wiley and Sons
Year: 1975
Tongue: English
Weight: 455 KB
Volume: 31
Category: Article
ISSN: 0031-8965
DOI: 10.1002/pssa.2210310225

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