✦ LIBER ✦

The impact of device scaling on the current fluctuations in MOSFET's

✍ Scribed by Ming-Horn Tsai; Tso-Ping Ma

No coin nor oath required. For personal study only.

📜 SIMILAR VOLUMES

The impact of intrinsic series resistanc

✍ Ng, K.K.; Lynch, W.T. 📂 Article 📅 1987 🏛 IEEE 🌐 English ⚖ 991 KB

A perspective on the theory of MOSFET sc

✍ Ning, T.H. 📂 Article 📅 2007 🏛 Institute of Electrical and Electronics Engineers ⚖ 836 KB

The impact of intrinsic device fluctuati

✍ Bhavnagarwala, A.J.; Xinghai Tang; Meindl, J.D. 📂 Article 📅 2001 🏛 IEEE 🌐 English ⚖ 197 KB

Studying the impact of carbon on device

✍ M.H. Lee; S.T. Chang; C.-Y. Peng; B.-F. Hsieh; S. Maikap; S.-H. Liao 📂 Article 📅 2008 🏛 Elsevier Science 🌐 English ⚖ 570 KB

On the reverse short channel effect in d

✍ Collaert, N.; Verheyen, P.; De Meyer, K. 📂 Article 📅 2000 🏛 IEEE 🌐 English ⚖ 186 KB

Impact of scaling on the high current be

✍ Boselli, G.; Reddy, V.; Duvvury, C. 📂 Article 📅 2004 🏛 IEEE 🌐 English ⚖ 451 KB