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A perspective on the theory of MOSFET scaling and its impact

✍ Scribed by Ning, T.H.

Book ID: 114586576
Publisher: Institute of Electrical and Electronics Engineers
Year: 2007
Weight: 836 KB
Volume: 12
Category: Article
ISSN: 1098-4232
DOI: 10.1109/n-ssc.2007.4785538

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