The fracture strength of nitrogen doped silicon wafers
β Scribed by Jan Vedde; Peter Gravesen
- Publisher
- Elsevier Science
- Year
- 1996
- Tongue
- English
- Weight
- 383 KB
- Volume
- 36
- Category
- Article
- ISSN
- 0921-5107
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π SIMILAR VOLUMES
The statistical fracture stress distribution of silicon wafers was obtained by biaxial plate bending tests in combination with finite element calculations. For the correct interpretation of these tests it is important that the finite element calculations imply wafer thickness and elastic properties
Solar power generation using polycrystalline silicon wafers has been rapidly growing in recent years. As a result, it is required to understand the strength characteristics of polycrystalline silicon wafers in order to enhance their quality. Scratches and material defects should be taken into consid