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The electronic properties of the interface structure between ZnO and amorphous HfO2

✍ Scribed by Byungki Ryu; K.J. Chang

Publisher: Elsevier Science
Year: 2009
Tongue: English
Weight: 320 KB
Volume: 404
Category: Article
ISSN: 0921-4526
DOI: 10.1016/j.physb.2009.08.184

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