The electrical properties of stacking faults and precipitates in heat-treated dislocation-free Czochralski silicon

✍ Scribed by Kimerling, L. C.; Leamy, H. J.; Patel, J. R.

• Book ID: 119997398
• Publisher: American Institute of Physics
• Year: 1977
• Tongue: English
• Weight: 511 KB
• Volume: 30
• Category: Article
• ISSN: 0003-6951
• DOI: 10.1063/1.89355