✦ LIBER ✦
EBIC/TEM Studies on the Relation between Electrical Properties, Crystallographic Structure, and Interaction with Point Defects of Epitaxial Stacking Faults in Silicon
✍ Scribed by M. Kittler; E. Bugiel
- Publisher
- John Wiley and Sons
- Year
- 1982
- Tongue
- English
- Weight
- 618 KB
- Volume
- 17
- Category
- Article
- ISSN
- 0232-1300
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