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The electrical behaviour of individual dislocations, shockley partials and stacking fault ribbons in silicon

✍ Scribed by A. Ourmazd; P.R. Wilshaw; G.R. Booker

Publisher: Elsevier Science
Year: 1983
Weight: 677 KB
Volume: 116
Category: Article
ISSN: 0378-4363
DOI: 10.1016/0378-4363(83)90313-3

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