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Influence of dissociation of individual dislocations in silicon into Shockley partials on their carrier recombination efficiency: A. Ourmazd, G.R. Booker Department of Metallurgy and Science of Materials, University of Oxford, Oxford, England


Publisher
Elsevier Science
Year
1978
Tongue
English
Weight
86 KB
Volume
21
Category
Article
ISSN
0038-1101

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