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The effects of thermal quenching on ion-beam-induced phase transformation detection by ion-beam-induced luminescence

✍ Scribed by G.E. Gosnell; C.J. Wetteland; J.R. Tesmer; M.G. Hollander; D.W. Cooke; I.V. Afanasyev; K.E. Sickafus

Publisher
Elsevier Science
Year
2005
Tongue
English
Weight
130 KB
Volume
241
Category
Article
ISSN
0168-583X

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## Abstract Energetic beams of electrons and ions are widely used to probe the microscopic properties of materials. Irradiation with charged beams in scanning electron microscopes (SEM) and focused ion beam (FIB) systems may result in the trapping of charge at irradiation induced or pre‐existing de