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The effects of thermal annealing on defect configurations in SI-GaAs

✍ Scribed by Jin, N.Y.; Chenggao, Fan; Dongliang, Lin (T.L.Lin)

Book ID: 123559779
Publisher: Elsevier Science
Year: 1988
Tongue: English
Weight: 580 KB
Volume: 7
Category: Article
ISSN: 0167-577X
DOI: 10.1016/0167-577X(88)90158-9

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