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An X-ray diffraction study of the effects of rapid thermal annealing on GaAs layers on Si substrates

✍ Scribed by J. Varrio; F. Riesz; J. Lammasniemi; M. Hovinen; M. Pessa


Book ID
119124351
Publisher
Elsevier Science
Year
1990
Tongue
English
Weight
287 KB
Volume
10
Category
Article
ISSN
0167-577X

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