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Effects of in-situ thermal annealing on defects associated with GaAs/Ge interface in GaAs/Ge/Si heterostructure

โœ Scribed by D.K. Kim; B.-T. Lee; Y.D. Woo; T.W. Kang; M.C. Paek


Book ID
119125101
Publisher
Elsevier Science
Year
1993
Tongue
English
Weight
344 KB
Volume
16
Category
Article
ISSN
0167-577X

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