Atomic force microscopic study of surface morphology in Si-doped epi-GaAs on Ge substrates: effect of off-orientation

✍ Scribed by Mantu Kumar Hudait; S.B. Krupanidhi

• Book ID: 114065478
• Publisher: Elsevier Science
• Year: 2000
• Tongue: English
• Weight: 333 KB
• Volume: 35
• Category: Article
• ISSN: 0025-5408
• DOI: 10.1016/s0025-5408(00)00278-6