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The effects of collimation on intrinsic stress in sputter-deposited metallic thin films

✍ Scribed by T. Janacek; D. Liu; S.K. Dew; M.J. Brett; T.J. Smy


Book ID
107864504
Publisher
Elsevier Science
Year
1994
Tongue
English
Weight
430 KB
Volume
253
Category
Article
ISSN
0040-6090

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Cr, Ti, Hf, Zr, Co, Ta, I'd, and Pt. The AI-Cr system was investigated in some detail using a conductance method and nuclear backscattering for reaction-rate measurements. The compounds CrAl, and Cr2AI,, were identified and their growth was found to be diffusion controlled. The temperature dependenc