𝔖 Bobbio Scriptorium
✦   LIBER   ✦

The effect of TEM sample thickness on nucleation and growth and dissolution of {311} defects in Si+ implanted Si

✍ Scribed by Jing-Hong Li; Mark E. Law; Craig Jasper; Kevin S. Jones


Publisher
Elsevier Science
Year
1998
Tongue
English
Weight
728 KB
Volume
1
Category
Article
ISSN
1369-8001

No coin nor oath required. For personal study only.


πŸ“œ SIMILAR VOLUMES