𝔖 Bobbio Scriptorium
✦   LIBER   ✦

Effect of lattice defects in the collector region of npn Si transistors on the degradation ofhFE

✍ Scribed by Ohyama, H. ;Nemoto, K.


Publisher
John Wiley and Sons
Year
1988
Tongue
English
Weight
635 KB
Volume
107
Category
Article
ISSN
0031-8965

No coin nor oath required. For personal study only.


πŸ“œ SIMILAR VOLUMES