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Process of defect formation in the collector region of an electron-irradiated npn Si transistor

✍ Scribed by Ohyama, H. ;Nemoto, K.

Publisher: John Wiley and Sons
Year: 1988
Tongue: English
Weight: 537 KB
Volume: 110
Category: Article
ISSN: 0031-8965
DOI: 10.1002/pssa.2211100132

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