✦ LIBER ✦
Dose rate dependence of radiation-induced lattice defects and performance degradation in npn Si bipolar transistors by 2-MeV electron irradiation
✍ Scribed by K. Hayama; K. Takakura; H. Ohyama; S. Kuboyama; E. Simoen; A. Mercha; C. Claeys
- Publisher
- Elsevier Science
- Year
- 2007
- Tongue
- English
- Weight
- 155 KB
- Volume
- 401-402
- Category
- Article
- ISSN
- 0921-4526
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