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The effect of substrate temperature on the oxidation behavior of erbium thick films

✍ Scribed by H.H. Shen; S.M. Peng; X.G. Long; X.S. Zhou; L. Yang; X.T. Zu

Book ID: 113940927
Publisher: Elsevier Science
Year: 2012
Tongue: English
Weight: 931 KB
Volume: 86
Category: Article
ISSN: 0042-207X
DOI: 10.1016/j.vacuum.2011.10.009

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