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Unusual thickness dependence of the dielectric constant of erbium oxide films

✍ Scribed by U. Saxena; O.N. Srivastava

Book ID: 107862186
Publisher: Elsevier Science
Year: 1976
Tongue: English
Weight: 593 KB
Volume: 33
Category: Article
ISSN: 0040-6090
DOI: 10.1016/0040-6090(76)90079-1

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