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The effect of gate overlap lightly doped drains on low temperature poly-Si thin film transistors

✍ Scribed by Jaehyun Cho; Sungwook Jung; Kyungsoo Jang; Hyungsik Park; Jongkyu Heo; Wonbaek Lee; DaeYoung Gong; Seungman Park; Hyungwook Choi; Hanwook Jung; Byoungdeog Choi; Junsin Yi

Book ID: 113800594
Publisher: Elsevier Science
Year: 2012
Tongue: English
Weight: 784 KB
Volume: 52
Category: Article
ISSN: 0026-2714
DOI: 10.1016/j.microrel.2011.08.009

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