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The effect of gate metal and SiO2 thickness on the generation of donor states at the Si-SiO2 interface

✍ Scribed by Fischetti, M. V.; Weinberg, Z. A.; Calise, J. A.


Book ID
120606659
Publisher
American Institute of Physics
Year
1985
Tongue
English
Weight
955 KB
Volume
57
Category
Article
ISSN
0021-8979

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