𝔖 Bobbio Scriptorium
✦   LIBER   ✦

Germanium nanocrystals in SiO 2 : relevance of the defect state distribution at the Si-SiO 2 interface

✍ Scribed by Beyer, Reinhard; Burghardt, Hubert; Borany, Johannes von


Book ID
120486329
Publisher
John Wiley and Sons
Year
2013
Tongue
English
Weight
239 KB
Volume
10
Category
Article
ISSN
1862-6351

No coin nor oath required. For personal study only.


πŸ“œ SIMILAR VOLUMES


Individual defects at the Si:SiO 2 inter
✍ Kirton, M J; Uren, M J; Collins, S; Schulz, M; Karmann, A; Scheffer, K πŸ“‚ Article πŸ“… 1989 πŸ› Institute of Physics 🌐 English βš– 966 KB
The peculiarities of Si/SiO2 interfaces
✍ T. Kryshtab; G. GΓ³mez Gasga; N. Korsunska; M. Baran; S. Kirillova; L. Khomenkova πŸ“‚ Article πŸ“… 2010 πŸ› Elsevier Science 🌐 English βš– 281 KB

Si-rich-SiO 2 layers with excess silicon of 45-50% were grown by RF magnetron co-sputtering from pure SiO 2 and Si targets and were studied by Raman scattering, HRTEM, electron-paramagnetic resonance and X-ray diffraction (XRD) methods as well as by photo-voltage technique operated at different temp