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The effect of biaxial strain on impurity diffusion in Si and SiGe

✍ Scribed by Arne Nylandsted Larsen; Nikolaj Zangenberg; Jacob Fage-Pedersen


Book ID
108215250
Publisher
Elsevier Science
Year
2005
Tongue
English
Weight
134 KB
Volume
124-125
Category
Article
ISSN
0921-5107

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