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The different behaviour of CiOi and CiCs defects in SiGe

✍ Scribed by J. Tan; G. Davies; S. Hayama; V.P. Markevich

Publisher: Elsevier Science
Year: 2006
Tongue: English
Weight: 193 KB
Volume: 9
Category: Article
ISSN: 1369-8001
DOI: 10.1016/j.mssp.2006.01.009

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