✦ LIBER ✦
The Origin and Properties of New Extended Defects Revealed by Etching in Plastically Deformed Si and SiGe
✍ Scribed by Eremenko, V. ;Abrosimov, N. ;Fedorov, A.
- Publisher
- John Wiley and Sons
- Year
- 1999
- Tongue
- English
- Weight
- 222 KB
- Volume
- 171
- Category
- Article
- ISSN
- 0031-8965
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