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THE DETERMINATION OF SP 3 FRACTION IN TETRAHEDRAL AMORPHOUS CARBON FILMS BY RAMAN AND X-RAY PHOTOELECTRON SPECTROSCOPY

โœ Scribed by CHEN, DIHU; JING, G. Y.; WEI, AIXIANG


Book ID
120980572
Publisher
World Scientific Publishing Company
Year
2002
Tongue
English
Weight
95 KB
Volume
16
Category
Article
ISSN
0217-9792

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๐Ÿ“œ SIMILAR VOLUMES


Investigation of tetrahedral amorphous c
โœ Tay, B. K.; Shi, X.; Tan, H. S.; Chua, Daniel H. C. ๐Ÿ“‚ Article ๐Ÿ“… 1999 ๐Ÿ› John Wiley and Sons ๐ŸŒ English โš– 142 KB ๐Ÿ‘ 2 views

Amorphous carbon containing very little hydrogen and having a highly tetrahedral structure has been prepared by the Filtered Cathodic Vacuum Arc (FCVA) technique under different deposition temperatures. Based on Raman measurement, it was found that the I D =I G intensity ratio, the G band peak posit