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Structure of amorphized C60 films studied by Raman spectroscopy and X-ray photoelectron spectroscopy

โœ Scribed by Ryosuke Ookawa; Katsumi Takahiro; Kiyoshi Kawatsura; Fumitaka Nishiyama; Shunya Yamamoto; Hiroshi Naramoto


Book ID
114167049
Publisher
Elsevier Science
Year
2003
Tongue
English
Weight
107 KB
Volume
206
Category
Article
ISSN
0168-583X

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Investigation of tetrahedral amorphous c
โœ Tay, B. K.; Shi, X.; Tan, H. S.; Chua, Daniel H. C. ๐Ÿ“‚ Article ๐Ÿ“… 1999 ๐Ÿ› John Wiley and Sons ๐ŸŒ English โš– 142 KB ๐Ÿ‘ 2 views

Amorphous carbon containing very little hydrogen and having a highly tetrahedral structure has been prepared by the Filtered Cathodic Vacuum Arc (FCVA) technique under different deposition temperatures. Based on Raman measurement, it was found that the I D =I G intensity ratio, the G band peak posit