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Determination of the thickness of ultrathin films by X-ray photoelectron spectroscopy

โœ Scribed by V. I. Nefedov; V. G. Yarzhemsky; I. S. Nefedova; R. Szargan


Book ID
110139027
Publisher
SP MAIK Nauka/Interperiodica
Year
2004
Tongue
English
Weight
43 KB
Volume
49
Category
Article
ISSN
1028-3358

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