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The complexity of generating minimum test sets for PLA's and monotone combinational circuits

✍ Scribed by Chakravarty, S.; Hunt, H.B., III; Ravi, S.S.; Rosenkrantz, D.J.

Book ID: 119772092
Publisher: IEEE
Year: 1989
Tongue: English
Weight: 509 KB
Volume: 38
Category: Article
ISSN: 0018-9340
DOI: 10.1109/12.24296

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