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The complementary nature of x-ray photoelectron spectroscopy and angle-resolved x-ray diffraction Part I: Background and theory

✍ Scribed by S. J. Kerber; T. L. Barr; G. P. Mann; W. A. Brantley; E. Papazoglou; J. C. Mitchell

Book ID
111786623
Publisher
Springer US
Year
1998
Tongue
English
Weight
61 KB
Volume
7
Category
Article
ISSN
1059-9495

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## Abstract Although not discussed in most reviews of quantitative x‐ray photoelectron spectroscopy (XPS), diffraction of the photoelectrons leaving a single crystal can lead to potential errors of a factor of two or more in the calculated surface composition. A series of experimental measurements