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Angle resolved X-ray photoelectron spectroscopy of the surface of Hg0.85Zn0.15Te and after passivation processes

โœ Scribed by A. Quemerais; K.H. Khelladi; D. Lemoine; R. Granger; R. Triboulet


Publisher
Elsevier Science
Year
1994
Tongue
English
Weight
431 KB
Volume
138
Category
Article
ISSN
0022-0248

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Angle-resolved x-ray photoelectron spect
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Coupons of polished aluminium, glass and polystyrene were exposed to radiofrequency (r.f.) plasmas containing helium, nitrogen and oxygen. Angle-resolved XPS measurements of the treated surfaces were made immediately, after a few days and after about 9 months. The data were interpreted in terms of a