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The attenuation length of photoelectrons in thin films of uranium

✍ Scribed by C. Lea; C. H. B. Mee

Publisher
John Wiley and Sons
Year
1968
Tongue
English
Weight
393 KB
Volume
25
Category
Article
ISSN
0370-1972

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Thin oxide Ðlms play an important role in the corrosion of metals. Using XPS it is possible in principle to obtain information on the chemical state of near-surface atoms, the stoichiometry of the surface layer and its thickness. A problem is the quantiÐcation of XPS spectra, due to the large uncert