An analytical expression for the escape probability of signal photoelectrons as a function of the depth of origin, energy and direction of emission from a solid has been found by solving a kinetic equation. The solution is expressed by a series of partial escape probabilities corresponding to contri
โฆ LIBER โฆ
The energy dependence of the photoelectron attenuation length via the oxidation of silicon
โ Scribed by I.T. McGovern; A.W. Parke; R.H. Williams
- Publisher
- Elsevier Science
- Year
- 1978
- Tongue
- English
- Weight
- 262 KB
- Volume
- 26
- Category
- Article
- ISSN
- 0038-1098
No coin nor oath required. For personal study only.
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