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The analysis of the leakage current of polycrystalline silicon thin-film transistors as a function of active layer thickness

✍ Scribed by H. Sehil; N.M. Rahmani; F. Raoult

Book ID: 113300549
Publisher: Elsevier Science
Year: 1995
Tongue: English
Weight: 525 KB
Volume: 42
Category: Article
ISSN: 0254-0584
DOI: 10.1016/0254-0584(95)01562-0

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