Polycrystalline samples of (CuInSe 2 ) 1--x (VSe) x alloys have been prepared by the usual melt and anneal technique in the composition range 0 x 0.5. X-ray diffraction (XRD), differential thermal analysis (DTA) and scanning electron microscopy techniques were used to characterize the products. By S
✦ LIBER ✦
The (AgInSe2)1–x(VSe)x system (0 ≤ x ≤ 0.5): X-ray diffraction and differential thermal analysis measurements
✍ Scribed by S. Durán; P. Grima; M. Muñoz; M. Quintero; J. Ruiz; L. Ceballos; J. M. Briceño; H. Romero
- Publisher
- John Wiley and Sons
- Year
- 2005
- Tongue
- English
- Weight
- 249 KB
- Volume
- 2
- Category
- Article
- ISSN
- 1862-6351
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