X-Ray Diffraction and Differential Thermal Analysis (DTA) Measurements on CuZn0.5InCrSe4
β Scribed by Grima Gallardo, P. ;Ruiz, J.
- Publisher
- John Wiley and Sons
- Year
- 1999
- Tongue
- English
- Weight
- 123 KB
- Volume
- 174
- Category
- Article
- ISSN
- 0031-8965
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Polycrystalline samples of (CuInSe 2 ) 1--x (VSe) x alloys have been prepared by the usual melt and anneal technique in the composition range 0 x 0.5. X-ray diffraction (XRD), differential thermal analysis (DTA) and scanning electron microscopy techniques were used to characterize the products. By S
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