✦ LIBER ✦

Test pattern generation for API faults in RAM

✍ Scribed by de Jong, P.; van de Goor, A.J.

Book ID: 119773154
Publisher: IEEE
Year: 1988
Tongue: English
Weight: 323 KB
Volume: 37
Category: Article
ISSN: 0018-9340
DOI: 10.1109/12.8710

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