✦ LIBER ✦

Test Pattern Generation for API Faults in RAM

✍ Scribed by Saluja, K.K.; Kinoshita, K.

Book ID: 114606856
Publisher: IEEE
Year: 1985
Tongue: English
Weight: 805 KB
Volume: C-34
Category: Article
ISSN: 0018-9340
DOI: 10.1109/tc.1985.1676572

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